Industry Participation
Talks & Demo -DENS Solution
In the last few years, state-of-the-art TEM's have enabled atomic resolution imaging and analysis, which has been achieved through the use of image or probe aberration-corrected TEM's. The performance of these TEM's as an imaging tool has proven to be extremely valuable in identifying various material structures. know more
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Speakar: Dr. Hugo Pérez
Title: In-situ Transmission Electron Microscopy: a MEMS-based route to explore untapped research possibilities at the nanoscale |